{"id":6292,"date":"2026-04-30T15:53:19","date_gmt":"2026-04-30T07:53:19","guid":{"rendered":"https:\/\/txjpcba.com\/?p=6292"},"modified":"2026-04-30T15:53:19","modified_gmt":"2026-04-30T07:53:19","slug":"what-is-ict-in-circuit-testing","status":"publish","type":"post","link":"https:\/\/txjpcba.com\/zh\/what-is-ict-in-circuit-testing\/","title":{"rendered":"What is ICT (In-Circuit Testing)?"},"content":{"rendered":"<h2 data-start=\"0\" data-end=\"37\"><strong data-start=\"0\" data-end=\"37\">ICT\uff08\u7dda\u8def\u5167\u6e2c\u8a66\uff09<\/strong><\/h2>\n<p data-start=\"39\" data-end=\"374\"><strong data-start=\"39\" data-end=\"67\">ICT\uff08\u7dda\u8def\u5167\u6e2c\u8a66\uff09<\/strong> is a widely used electrical testing method in <strong data-start=\"114\" data-end=\"130\">PCB \u7d44\u88dd<\/strong> that verifies the performance and integrity of individual components and circuits on a fully assembled PCB. It is commonly applied after <a href=\"https:\/\/txjpcba.com\/zh\/smt-%e7%b5%84%e8%a3%9d%e6%9c%8d%e5%8b%99\/\"><strong data-start=\"268\" data-end=\"284\">SMT \u7d44\u88dd<\/strong><\/a> to ensure that each component is correctly placed, soldered, and functioning as intended.<\/p>\n<p data-start=\"376\" data-end=\"503\">ICT is one of the most effective ways to detect manufacturing defects early and ensure high product quality in mass production.<\/p>\n<figure id=\"attachment_6293\" aria-describedby=\"caption-attachment-6293\" style=\"width: 800px\" class=\"wp-caption aligncenter\"><img fetchpriority=\"high\" decoding=\"async\" class=\"size-full wp-image-6293\" src=\"https:\/\/txjpcba.com\/wp-content\/uploads\/2026\/04\/What-is-ICT-In-Circuit-Testing.jpg\" alt=\"What is ICT (In-Circuit Testing)\" width=\"800\" height=\"597\" srcset=\"https:\/\/txjpcba.com\/wp-content\/uploads\/2026\/04\/What-is-ICT-In-Circuit-Testing.jpg 800w, https:\/\/txjpcba.com\/wp-content\/uploads\/2026\/04\/What-is-ICT-In-Circuit-Testing-300x224.jpg 300w, https:\/\/txjpcba.com\/wp-content\/uploads\/2026\/04\/What-is-ICT-In-Circuit-Testing-768x573.jpg 768w, https:\/\/txjpcba.com\/wp-content\/uploads\/2026\/04\/What-is-ICT-In-Circuit-Testing-16x12.jpg 16w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/><figcaption id=\"caption-attachment-6293\" class=\"wp-caption-text\">What is ICT (In-Circuit Testing)<\/figcaption><\/figure>\n<h2 data-section-id=\"9oa72d\" data-start=\"505\" data-end=\"527\">What Does ICT Test?<\/h2>\n<p data-start=\"529\" data-end=\"623\">ICT focuses on checking the electrical behavior of each component on the board. It can detect:<\/p>\n<ul data-start=\"625\" data-end=\"875\">\n<li data-section-id=\"lbftlz\" data-start=\"625\" data-end=\"663\">Open circuits (broken connections)<\/li>\n<li data-section-id=\"vy2gnc\" data-start=\"664\" data-end=\"705\">Short circuits (unwanted connections)<\/li>\n<li data-section-id=\"aglb9s\" data-start=\"706\" data-end=\"772\">Incorrect component values (e.g., wrong resistor or capacitor)<\/li>\n<li data-section-id=\"1ybd368\" data-start=\"773\" data-end=\"795\">\u7f3a\u5931\u7684\u5143\u4ef6<\/li>\n<li data-section-id=\"9u6d6d\" data-start=\"796\" data-end=\"828\">Faulty or damaged components<\/li>\n<li data-section-id=\"2sfp4n\" data-start=\"829\" data-end=\"875\">Polarity errors (e.g., diodes, capacitors)<\/li>\n<\/ul>\n<p data-start=\"877\" data-end=\"964\">\ud83d\udc49 ICT ensures that the PCB Assembly is electrically correct before functional testing.<\/p>\n<p align=\"center\"><a href=\"\/zh\/%e5%8f%96%e5%be%97-pcb-%e7%b5%84%e4%bb%b6%e5%a0%b1%e5%83%b9\/\"><button style=\"background: black; color: white; padding: 8px 20px; border: none; cursor: pointer;\">\u53d6\u5f97 PCB \u7d44\u88dd\u5831\u50f9<\/button><\/a><\/p>\n<h2 data-section-id=\"1szi849\" data-start=\"966\" data-end=\"982\">How ICT Works<\/h2>\n<p data-start=\"984\" data-end=\"1064\">ICT uses a <strong data-start=\"995\" data-end=\"1019\">bed-of-nails fixture<\/strong> to make contact with test points on the PCB:<\/p>\n<ol data-start=\"1066\" data-end=\"1262\">\n<li data-section-id=\"lwrzio\" data-start=\"1066\" data-end=\"1111\">The assembled PCB is placed on a fixture<\/li>\n<li data-section-id=\"1f9gwx5\" data-start=\"1112\" data-end=\"1166\">Spring-loaded pins contact designated test points<\/li>\n<li data-section-id=\"elyqv3\" data-start=\"1167\" data-end=\"1215\">Electrical signals are applied and measured<\/li>\n<li data-section-id=\"1hjwr1w\" data-start=\"1216\" data-end=\"1262\">Results are compared with expected values<\/li>\n<\/ol>\n<p data-start=\"1264\" data-end=\"1323\">This allows fast and accurate testing of each circuit node.<\/p>\n<h2 data-section-id=\"1glij9x\" data-start=\"1325\" data-end=\"1348\">Types of ICT Methods<\/h2>\n<h3 data-section-id=\"k2abmf\" data-start=\"1350\" data-end=\"1386\">Bed-of-Nails ICT (Fixture-Based)<\/h3>\n<ul data-start=\"1388\" data-end=\"1500\">\n<li data-section-id=\"vr9wil\" data-start=\"1388\" data-end=\"1418\">Uses a custom test fixture<\/li>\n<li data-section-id=\"bqi6j2\" data-start=\"1419\" data-end=\"1461\">High-speed testing for mass production<\/li>\n<li data-section-id=\"1ido0mz\" data-start=\"1462\" data-end=\"1500\">High upfront cost (fixture design)<\/li>\n<\/ul>\n<h3 data-section-id=\"8opnl5\" data-start=\"1502\" data-end=\"1526\">Flying Probe Testing<\/h3>\n<ul data-start=\"1528\" data-end=\"1678\">\n<li data-section-id=\"l2fgpi\" data-start=\"1528\" data-end=\"1572\">Uses movable probes instead of a fixture<\/li>\n<li data-section-id=\"iswraz\" data-start=\"1573\" data-end=\"1606\">No need for dedicated tooling<\/li>\n<li data-section-id=\"1rw7jrv\" data-start=\"1607\" data-end=\"1635\">Slower but more flexible<\/li>\n<li data-section-id=\"emlmol\" data-start=\"1636\" data-end=\"1678\">Ideal for prototypes and small batches<\/li>\n<\/ul>\n<p data-start=\"1680\" data-end=\"1751\">\ud83d\udc49 Flying probe is often used when ICT fixtures are not cost-effective.<\/p>\n<h2 data-section-id=\"1957j0q\" data-start=\"1753\" data-end=\"1773\">Advantages of ICT<\/h2>\n<ul data-start=\"1775\" data-end=\"2000\">\n<li data-section-id=\"1xqltau\" data-start=\"1775\" data-end=\"1831\">High fault coverage (detects most electrical issues)<\/li>\n<li data-section-id=\"1ttpdy5\" data-start=\"1832\" data-end=\"1868\">Fast testing speed in production<\/li>\n<li data-section-id=\"19qusnm\" data-start=\"1869\" data-end=\"1904\">Accurate and repeatable results<\/li>\n<li data-section-id=\"dxerxi\" data-start=\"1905\" data-end=\"1954\">Reduces defective products reaching customers<\/li>\n<li data-section-id=\"10jzw7g\" data-start=\"1955\" data-end=\"2000\">Improves overall <strong data-start=\"1974\" data-end=\"1990\">PCB \u7d44\u88dd<\/strong> quality<\/li>\n<\/ul>\n<h2 data-section-id=\"dtsz49\" data-start=\"2002\" data-end=\"2023\">Limitations of ICT<\/h2>\n<ul data-start=\"2025\" data-end=\"2212\">\n<li data-section-id=\"1toka3f\" data-start=\"2025\" data-end=\"2063\">Requires test points in PCB design<\/li>\n<li data-section-id=\"14lkrn6\" data-start=\"2064\" data-end=\"2093\">High initial fixture cost<\/li>\n<li data-section-id=\"16qnf6\" data-start=\"2094\" data-end=\"2142\">Cannot fully verify real-world functionality<\/li>\n<li data-section-id=\"xic889\" data-start=\"2143\" data-end=\"2212\">Less effective for very high-density boards without proper design<\/li>\n<\/ul>\n<h2 data-section-id=\"1aodobb\" data-start=\"2214\" data-end=\"2248\">ICT vs Functional Testing (FCT)<\/h2>\n<div class=\"TyagGW_tableContainer\">\n<div class=\"group TyagGW_tableWrapper flex flex-col-reverse w-fit\" tabindex=\"-1\">\n<table class=\"w-fit min-w-(--thread-content-width)\" data-start=\"2250\" data-end=\"2512\">\n<thead data-start=\"2250\" data-end=\"2288\">\n<tr data-start=\"2250\" data-end=\"2288\">\n<th class=\"\" data-start=\"2250\" data-end=\"2260\" data-col-size=\"sm\">\u7279\u9ede<\/th>\n<th class=\"\" data-start=\"2260\" data-end=\"2266\" data-col-size=\"sm\">ICT<\/th>\n<th class=\"\" data-start=\"2266\" data-end=\"2288\" data-col-size=\"sm\">\u529f\u80fd\u6e2c\u8a66<\/th>\n<\/tr>\n<\/thead>\n<tbody data-start=\"2326\" data-end=\"2512\">\n<tr data-start=\"2326\" data-end=\"2385\">\n<td data-start=\"2326\" data-end=\"2334\" data-col-size=\"sm\">Focus<\/td>\n<td data-start=\"2334\" data-end=\"2358\" data-col-size=\"sm\">Individual components<\/td>\n<td data-start=\"2358\" data-end=\"2385\" data-col-size=\"sm\">Overall system behavior<\/td>\n<\/tr>\n<tr data-start=\"2386\" data-end=\"2411\">\n<td data-start=\"2386\" data-end=\"2394\" data-col-size=\"sm\">\u901f\u5ea6<\/td>\n<td data-start=\"2394\" data-end=\"2401\" data-col-size=\"sm\">Fast<\/td>\n<td data-start=\"2401\" data-end=\"2411\" data-col-size=\"sm\">\u8f03\u6162<\/td>\n<\/tr>\n<tr data-start=\"2412\" data-end=\"2469\">\n<td data-start=\"2412\" data-end=\"2423\" data-col-size=\"sm\">\u8986\u84cb\u7bc4\u570d<\/td>\n<td data-start=\"2423\" data-end=\"2443\" data-col-size=\"sm\">Electrical faults<\/td>\n<td data-start=\"2443\" data-end=\"2469\" data-col-size=\"sm\">Functional performance<\/td>\n<\/tr>\n<tr data-start=\"2470\" data-end=\"2512\">\n<td data-start=\"2470\" data-end=\"2483\" data-col-size=\"sm\">Setup cost<\/td>\n<td data-start=\"2483\" data-end=\"2500\" data-col-size=\"sm\">High (fixture)<\/td>\n<td data-start=\"2500\" data-end=\"2512\" data-col-size=\"sm\">\u4e2d\u5ea6<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n<\/div>\n<p data-start=\"2514\" data-end=\"2597\">\ud83d\udc49 ICT and functional testing are often used together in <strong data-start=\"2571\" data-end=\"2587\">SMT \u7d44\u88dd<\/strong> \u9805\u76ee\u3002.<\/p>\n<h2 data-section-id=\"2yxdf1\" data-start=\"2599\" data-end=\"2619\">When is ICT Used?<\/h2>\n<p data-start=\"2621\" data-end=\"2646\">ICT is most suitable for:<\/p>\n<ul data-start=\"2648\" data-end=\"2825\">\n<li data-section-id=\"12pa1uu\" data-start=\"2648\" data-end=\"2684\">Medium to high-volume production<\/li>\n<li data-section-id=\"f1ftmu\" data-start=\"2685\" data-end=\"2724\">Products requiring high reliability<\/li>\n<li data-section-id=\"lp3ycm\" data-start=\"2725\" data-end=\"2757\">Complex PCB Assembly designs<\/li>\n<li data-section-id=\"1sr3nxm\" data-start=\"2758\" data-end=\"2825\">Industries like automotive, medical, and industrial electronics<\/li>\n<\/ul>\n<h2 data-section-id=\"p0xhbr\" data-start=\"2827\" data-end=\"2859\">Design Considerations for ICT<\/h2>\n<p data-start=\"2861\" data-end=\"2893\">To enable effective ICT testing:<\/p>\n<ul data-start=\"2895\" data-end=\"3037\">\n<li data-section-id=\"105youy\" data-start=\"2895\" data-end=\"2925\">Add sufficient test points<\/li>\n<li data-section-id=\"3q1ntn\" data-start=\"2926\" data-end=\"2962\">Ensure proper spacing for probes<\/li>\n<li data-section-id=\"1ttkkci\" data-start=\"2963\" data-end=\"2990\">Avoid obstructed access<\/li>\n<li data-section-id=\"hzspg6\" data-start=\"2991\" data-end=\"3037\">Follow DFT (Design for Testing) guidelines<\/li>\n<\/ul>\n<p data-start=\"3039\" data-end=\"3089\">Good design significantly improves ICT efficiency.<\/p>\n<h2 data-section-id=\"171krz9\" data-start=\"3091\" data-end=\"3129\">Role of ICT in PCB Assembly Process<\/h2>\n<p data-start=\"3131\" data-end=\"3170\">In a typical <strong data-start=\"3144\" data-end=\"3160\">PCB \u7d44\u88dd<\/strong> workflow:<\/p>\n<ul data-start=\"3172\" data-end=\"3342\">\n<li data-section-id=\"2t8yo0\" data-start=\"3172\" data-end=\"3218\">Performed after SMT Assembly and soldering<\/li>\n<li data-section-id=\"1oiuh0v\" data-start=\"3219\" data-end=\"3261\">Identifies manufacturing defects early<\/li>\n<li data-section-id=\"7tynb7\" data-start=\"3262\" data-end=\"3297\">Reduces rework and repair costs<\/li>\n<li data-section-id=\"1mo5jib\" data-start=\"3298\" data-end=\"3342\">Improves yield and production efficiency<\/li>\n<\/ul>\n<h2 data-section-id=\"8dtpi\" data-start=\"3344\" data-end=\"3357\">\u7e3d\u7d50<\/h2>\n<p data-start=\"3359\" data-end=\"3659\">ICT (In-Circuit Testing) is a powerful and essential testing method in <a href=\"https:\/\/txjpcba.com\/zh\/pcb-%e8%a3%9d%e9%85%8d\/\"><strong data-start=\"3430\" data-end=\"3446\">PCB \u7d44\u88dd<\/strong><\/a>, providing fast and accurate verification of electrical performance at the component level. When combined with <strong data-start=\"3558\" data-end=\"3574\">SMT \u7d44\u88dd<\/strong> and functional testing, ICT helps ensure high-quality, reliable electronic products.<\/p>\n<p align=\"center\"><a href=\"\/zh\/%e5%8f%96%e5%be%97-pcb-%e7%b5%84%e4%bb%b6%e5%a0%b1%e5%83%b9\/\"><button style=\"background: black; color: white; padding: 8px 20px; border: none; cursor: pointer;\">\u53d6\u5f97 PCB \u7d44\u88dd\u5831\u50f9<\/button><\/a><\/p>\n<p style=\"text-align: center;\">\u4e00\u6b65\u5230\u4f4d\uff0c\u7372\u5f97\u5c08\u5bb6\u5efa\u8b70\u548c\u7cbe\u78ba\u5b9a\u50f9\u3002\u7acb\u5373\u7d22\u53d6\u5831\u50f9\u3002.<br \/>\n\u6211\u5011\u63d0\u4f9b\u5c08\u696d\u7684 PCB \u88dd\u914d\u670d\u52d9\uff0c\u5305\u62ec SMT\u3001DIP \u53ca\u5b8c\u6574\u7684\u7d71\u5305\u89e3\u6c7a\u65b9\u6848\u3002.<\/p>\n<p style=\"text-align: center;\">\u2714 \u63d0\u4f9b NDA \u2714 24 \u5c0f\u6642\u5167\u5feb\u901f\u5831\u50f9 \u2714 ISO \u8a8d\u8b49\u5de5\u5ee0 \u2714 \u4e00\u7ad9\u5f0f PCB &amp; PCBA \u670d\u52d9<\/p>","protected":false},"excerpt":{"rendered":"<p>ICT (In-Circuit Testing) ICT (In-Circuit Testing) is a widely used electrical testing method in PCB Assembly that verifies the performance [&hellip;]<\/p>","protected":false},"author":1,"featured_media":6293,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"default","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center 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center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"footnotes":""},"categories":[71,445],"tags":[1218,1214,1217,1215,1210,1211,1212,1216,1213,975],"class_list":["post-6292","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-faqs","category-pcb-assembly-faqs","tag-assembled-board","tag-bed-of-nails-test","tag-flex-assembly","tag-flying-probe-testing","tag-ict-in-circuit-testing","tag-ict-testing-pcb-assembly","tag-in-circuit-testing-pcba","tag-pcb-assemblage-2","tag-pcb-electrical-testing","tag-smt-assembly-testing"],"_links":{"self":[{"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/posts\/6292","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/comments?post=6292"}],"version-history":[{"count":1,"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/posts\/6292\/revisions"}],"predecessor-version":[{"id":6294,"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/posts\/6292\/revisions\/6294"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/media\/6293"}],"wp:attachment":[{"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/media?parent=6292"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/categories?post=6292"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/txjpcba.com\/zh\/wp-json\/wp\/v2\/tags?post=6292"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}